Accessories for the Model 4002/4003 TLP+™

20ns Risetime Filter – Model 40010-U

The 20ns risetime filter provides 20ns up to 30 amp system

30ns Risetime Filter – Model 40010-WC

The 30ns risetime filter provides 30ns up to 30 amp system

40ns Risetime Filter – Model 40010-VC

The 40ns risetime filter provides 40ns up to 30 amp system

Aluminum Test Stand – Model 43002

The aluminum test stand is to stabilize DUT cables, during use.

DUT Cable for Test Stand – Model 43102

Test stand DUT cable (Section 1; 18” length)

DUT Cable, 2 leads – Model 44202

DUT cable with 2 leads, for 48 pin DIP Zip test fixture (Multiple ground pin)

DUT Cable, 3 leads – Model 44203

DUT cable with 3 leads, for 48 pin DIP Zip test fixture (Multiple ground pin)

DUT Cable, 4 leads – Model 44204

DUT cable with 4 leads, for 48 pin DIP Zip test fixture (Multiple ground pin)

HBM Dual Wafer Probe – Model 45002WP/45003WP

The HBM dual wafer probe includes 2 DUT cables, needles and accessories

Model 45003 Wafer Probe Data Sheet

HBM Dual Wafer Probe 3rdArm Assembly – Model 45010

The 3rd arm assembly is for use with the HBM Dual Wafer Probe; it is a single probe, and includes a leakage box kit

High Z (150Ω source Z) – Model 47150

This High Z accessory is for use with the for HBM Dual Wafer Probe; it includes two (2) 50Ω Resistors (Model 47150 = 50 ohm (set of 2), Source Z = 150 ohms)

High Z (250Ω source Z) – Model 47250

This High Z accessory is for use with the HBM Dual Wafer Probe; it includes two (2) 100Ω Resistors (Model 47250 = 100 ohm (set of 2), Source Z = 250 ohms)

High Z (450Ω source Z) – Model 47450

This High Z accessory is for use with the HBM Dual Wafer Probe; it includes two (2) 200Ω Resistors (Model 47450 = 200 ohm (set of 2), Source Z = 450 ohms)

High Z Set

Three (3) sets of 2 resistors of each type of High Z, as shown above, sold as a set (Model 47150, 47250 and 47450)

Needle: Chisel tipped – Model 45104

Chisel tipped needles (0.026” dia.) for use with the HBM Dual Wafer Probe; replacement, quantity one (1) each.  Multiple needles may be purchased at one time.  This needle type is typically used for testing BGA packaged devices (dead bug style).

Needle: Osmium tipped – Model 45102

Osmium tipped needles (0.026” dia.) for use with the HBM Dual Wafer Probe; replacement, quantity one (1) each. Multiple needles may be purchased at one time.  This needle type is typically used for regular wafer probing.

 

 

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