Accessories for the Model 4002/4003 TLP+™
20ns Risetime Filter – Model 40010-U
The 20ns risetime filter provides 20ns up to 30 amp system
30ns Risetime Filter – Model 40010-WC
The 30ns risetime filter provides 30ns up to 30 amp system
40ns Risetime Filter – Model 40010-VC
The 40ns risetime filter provides 40ns up to 30 amp system
Aluminum Test Stand – Model 43002
The aluminum test stand is to stabilize DUT cables during use.
DUT Cable for Test Stand – Model 43102
Test stand DUT cable (Section 1; 18” length)
DUT Cable, 2 leads – Model 44202
DUT cable with 2 leads, for 48 pin DIP Zip test fixture (Multiple ground pin)
DUT Cable, 3 leads – Model 44203
DUT cable with 3 leads, for 48 pin DIP Zip test fixture (Multiple ground pin)
DUT Cable, 4 leads – Model 44204
DUT cable with 4 leads, for 48 pin DIP Zip test fixture (Multiple ground pin)
HBM Dual Wafer Probe – Model 45003WP
The HBM dual wafer probe includes 2 DUT cables, needles and accessories
Model 45003 Wafer Probe Data Sheet
HBM Dual Wafer Probe 3rdArm Assembly – Model 45010
The 3rd arm assembly is for use with the HBM Dual Wafer Probe; it is a single probe, and includes a leakage box kit
High Z (150Ω source Z) – Model 47150
This High Z accessory is for use with the for HBM Dual Wafer Probe; it includes two (2) 50Ω Resistors (Model 47150 = 50 ohm (set of 2), Source Z = 150 ohms)
High Z (250Ω source Z) – Model 47250
This High Z accessory is for use with the HBM Dual Wafer Probe; it includes two (2) 100Ω Resistors (Model 47250 = 100 ohm (set of 2), Source Z = 250 ohms)
High Z (450Ω source Z) – Model 47450
This High Z accessory is for use with the HBM Dual Wafer Probe; it includes two (2) 200Ω Resistors (Model 47450 = 200 ohm (set of 2), Source Z = 450 ohms)
High Z Set
Three (3) sets of 2 resistors of each type of High Z, as shown above, sold as a set (Model 47150, 47250 and 47450)
Needle: Osmium tipped – Model 45102
Osmium tipped needles (0.026” dia.) for use with the HBM Dual Wafer Probe; replacement, quantity one (1) each. Multiple needles may be purchased at one time. This needle type is typically used for regular wafer probing.
Needle: Chisel tipped – Model 45104
Chisel tipped needles (0.026” dia.) for use with the HBM Dual Wafer Probe; replacement, quantity one (1) each. Multiple needles may be purchased at one time. This needle type is typically used for testing BGA packaged devices (dead bug style).
Needle: Osmium tipped – Model 45121
Osmium tipped needles (0.026” dia.) More robust version of the Model 45102 needle.