Option for the Model 4702 HMM+™

HMM +I/-I Waveform – Model 4702-02

The HMM +I/-I waveform option provides either the fast or slow part of the threats for device testing.

Accessory for the Model 4702 HMM+™

HMM Dual Wafer Probe – Model 45003WP

The HMM dual wafer probe accessory includes DUT cables, needles and accessories for wafer testing.

HMM Wafer Probe Adapter Block – Model 47002

For current TLP customers who already own a Model 45002WP (HBM Dual Wafer Probe); to be used with the Model 4702 HMM+ system.

Visit us at the EOS/ESD Symposium!

We will be attending the 2017 EOS/ESD Symposium in Tucson, AZ, September 11-13. Stop by booth 703 at the Westin La Paloma in Tucson. Monday 6pm-9pm; Tuesday 9:30am-5:30pm; and Wednesday 8:30am-1:30. Hope to see you there!

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