Accessories for the Model 4012 VFTLP+™
External Parametric Tester Option
Allows connection of an external tester for more extensive characterization of functional testing of DUT in between pulse tests.
BGA-TF Test Fixture – Model 40312
BGA-TF Test Fixture (includes one BGA probe); manufactured by Barth Electronics, Inc.
RF Probe Head – Model I40-GS-xxx
RF Probe Head for use with either the Vacuum or Magnetic VFTLP+ Wafer Probe Positioner (xxx= micron spacing); manufactured by Cascade Microtech®
Wafer Probe Positioner, Magnetic – Model MPHM-L
VFTLP+ Wafer Probe Positioner (Magnetic); manufactured by Cascade Microtech®
Wafer Probe Positioner, Vacuum – Model MPHV-L
VFTLP+ Wafer Probe Positioner (Vacuum); manufactured by Cascade Microtech®